FDTD Characterization of Waveguide-Probe Structures
نویسندگان
چکیده
The finite-difference time-domain (FDTD) technique is applied in the calculation of the S-parameters of diode mounting and waveguide-probe structures. The influence of the critical geometrical design parameters on the coupling of the coplanar feedline probe to the waveguide is investigated. A waveguide absorber based on analytic Green’s functions is used to minimize the reflections over a wide band of frequencies.
منابع مشابه
Time-domain Characterization of Diode Mounting Structures
The application of the FDTD technique in the calculation of the S-parameters of specific diode mounting and waveguide probe structures is discussed in this paper. Comparative results are given and the FDTD technique is evaluated as an optimized CAD tool. Introduction The finite difference time domain method is used in the RF characterization of diode mounting and waveguide probe structures. A v...
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